International colloquium on scanning tunneling microscopyKAWAZU, Akira; SHIGEKAWA, Hidemi; TSUKADA, Masaru et al.Japanese journal of applied physics. 1995, Vol 34, Num 6B, issn 0021-4922, 116 p., 1Conference Proceedings

International Colloquium on Scanning Tunneling MicroscopyHOSOKI, Shigeyuki; IKAI, Atsushi; KAWAZU, Akira et al.Japanese journal of applied physics. 1997, Vol 36, Num 6B, pp 3789-3916, issn 0021-4922, 1Conference Proceedings

Microwear of silicon surfacesANDOH, Y; KANEKO, R.Japanese journal of applied physics. 1995, Vol 34, Num 6B, pp 3380-3381, issn 0021-4922, 1Conference Paper

Fractal behavior in the magnetoresistance of chaotic billiardsNEWBURY, R; TAYLOR, R. P; SACHRAJDA, A. S et al.Japanese journal of applied physics. 1997, Vol 36, Num 6B, pp 3991-3995, issn 0021-4922, 1Conference Paper

Fundamental physics of single electron transportKOBAYASHI, S.-I.Japanese journal of applied physics. 1997, Vol 36, Num 6B, pp 3956-3959, issn 0021-4922, 1Conference Paper

Interface characterization of semiconductor quantum nanostructuresPLOOG, K. H.Japanese journal of applied physics. 1997, Vol 36, Num 6B, pp 4025-4030, issn 0021-4922, 1Conference Paper

A single electron neuron deviceKIRIHARA, M; TANIGUCHI, K.Japanese journal of applied physics. 1997, Vol 36, Num 6B, pp 4172-4175, issn 0021-4922, 1Conference Paper

Aharonov-Bohm effect in quantum dotsAKERA, H.Japanese journal of applied physics. 1997, Vol 36, Num 6B, pp 3974-3977, issn 0021-4922, 1Conference Paper

Can ohmic spikes define quantum systems?TAYLOR, R. P; NEWBURY, R; SACHRAJDA, A. S et al.Japanese journal of applied physics. 1997, Vol 36, Num 6B, pp 3964-3967, issn 0021-4922, 1Conference Paper

Theoretical simulation of atomic force microscope based on cluster modelsSASAKI, N; TSUKADA, M.Japanese journal of applied physics. 1995, Vol 34, Num 6B, pp 3319-3324, issn 0021-4922, 1Conference Paper

Analysis of heat-treated 6H-SiC(0001) surface using scanning tunneling microscopyMARUMOTO, Y; TSUKAMOTO, T; HIRAI, M et al.Japanese journal of applied physics. 1995, Vol 34, Num 6B, pp 3351-3353, issn 0021-4922, 1Conference Paper

Metrology of atomic force microscopy for Si nano-structuresNAGASE, M; NAMATSU, H; KURIHARA, K et al.Japanese journal of applied physics. 1995, Vol 34, Num 6B, pp 3382-3387, issn 0021-4922, 1Conference Paper

Scanning tunneling microscope observation of the metal-adsorbed layered semiconductor surfacesABE, H; KATAOKA, K; UENO, K et al.Japanese journal of applied physics. 1995, Vol 34, Num 6B, pp 3342-3345, issn 0021-4922, 1Conference Paper

Dual optical levers for atomic force microscopyKAWAKATSU, H; BLEULER, H; SAITO, T et al.Japanese journal of applied physics. 1995, Vol 34, Num 6B, pp 3400-3402, issn 0021-4922, 1Conference Paper

Improvement of Kelvin probe force microscope (KFM) systemYASUTAKE, M.Japanese journal of applied physics. 1995, Vol 34, Num 6B, pp 3403-3405, issn 0021-4922, 1Conference Paper

Nanometer modifications of non-conductive materials using resist-films by atomic force microscopyYAMAMOTO, S.-I; YAMADA, H; TOKUMOTO, H et al.Japanese journal of applied physics. 1995, Vol 34, Num 6B, pp 3396-3399, issn 0021-4922, 1Conference Paper

New charge density modulations in confined regions of reconstructed Pt(100) surfaceCHIA-SENG CHANG; WEI BIN SU; TSONG, T. T et al.Japanese journal of applied physics. 1995, Vol 34, Num 6B, pp 3329-3335, issn 0021-4922, 1Conference Paper

Recent advances in nanostructural investigations and modifications of solid surfaces by scanning probe methodsWIESENDANGER, R.Japanese journal of applied physics. 1995, Vol 34, Num 6B, pp 3388-3395, issn 0021-4922, 1Conference Paper

Role of diffusion in atomic manipulation on silicon by scanning tunneling microscopeDEHUAN HUANG; GREY, F; AONO, M et al.Japanese journal of applied physics. 1995, Vol 34, Num 6B, pp 3373-3375, issn 0021-4922, 1Conference Paper

Self-assembly of 2-thiocytosine molecules adsorbed on Au(111) surfaceKATSUMATA, S; IDE, A.Japanese journal of applied physics. 1995, Vol 34, Num 6B, pp 3360-3362, issn 0021-4922, 1Conference Paper

Chemical approach to nanofabrication : modifications of silicon surfaces patterned by scanning probe anodizationSUGIMURA, H; NAKAGIRI, N.Japanese journal of applied physics. 1995, Vol 34, Num 6B, pp 3406-3411, issn 0021-4922, 1Conference Paper

High field effects and methods useful for transferring atoms in scanning tunneling microscopeTSONG, T. T; CHIA-SENG CHANG.Japanese journal of applied physics. 1995, Vol 34, Num 6B, pp 3309-3318, issn 0021-4922, 1Conference Paper

Barrier-height imaging of oxygen-adsorbed Si(111) 7 x 7 surfacesKUROKAWA, S; YUASA, M; SAKAI, A et al.Japanese journal of applied physics. 1997, Vol 36, Num 6B, pp 3860-3863, issn 0021-4922, 1Conference Paper

Conductance oscillations in hopping conduction systems fabricated by focused ion beam implantationKONDO, H; IWANO, H; NAKATSUKA, O et al.Japanese journal of applied physics. 1997, Vol 36, Num 6B, pp 4046-4048, issn 0021-4922, 1Conference Paper

Construction of semiconductor nanoparticle layers on gold by self-assembly techniqueNAKANISHI, T; OHTANI, B; UOSAKI, K et al.Japanese journal of applied physics. 1997, Vol 36, Num 6B, pp 4053-4056, issn 0021-4922, 1Conference Paper